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서지주요정보
Cluster secondary ion mass spectrometry : principles and applications
서명 / 저자	Cluster secondary ion mass spectrometry : principles and applications / Christine M. Mahoney.
저자명	Mahoney, Christine M., 1975-
발행사항	Hoboken, New Jersey : John Wiley ＆ Sons, Inc., [2013]

등록번호

00025498

소장위치 / 청구기호

6층 과학·기술자료실 / QD96.S43 M34 2013

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서지기타정보
청구기호	QD96.S43 M34 2013
형태사항	xiii, 348 p. : ill. ; 25 cm.
언어	English
서지주기	Includes bibliographical references and index.
주제	Secondary ion mass spectrometry.
LCCN	2012045181
ISBN	9780470886052 (hardback) :
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전체보기

Raman spectroscopy and its application in nanostructures Zhang, Shu-Lin QD96.R34 Z433 2012
An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Fearn, Sarah QD96.S43 F435 2015eb
Cluster secondary ion mass spectrometry : principles and applications Mahoney, Christine M QD96.S43 M34 2013
Secondary ion mass spectrometry : an introduction to principles and practices Van der Heide, Paul QD96.S43 V36 2014
Attosecond and XUV physics : ultrafast dynamics and spectroscopy Vrakking, Marc QD96.U4 A88 2014

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