서지주요정보
Interferometry for precision measurement
서명 / 저자 Interferometry for precision measurement / Peter Langenbeck.
저자명 Langenbeck, Peter, author.
단체명 Society of Photo-optical Instrumentation Engineers publisher.
발행사항 Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, 2014
Online Access http://dx.doi.org/10.1117/3.928443 URL

서지기타정보

서지기타정보
청구기호 QC411 .L24 2014eb
형태사항 1 online resource (xiv, 240 pages) : illustrations.
총서명 Tutorial texts in optical engineering ; volume TT 94
언어 English
일반주기 "SPIE Digital Library."--Website.
서지주기 Includes bibliographical references.
내용 Known methods : an assessment of the state of the art, Newton and Fizeau -- From extended light source to collimated illumination -- Interference visualized by vector diagrams -- Optical laboratory equipment -- Straight lines and right angles -- Polygons -- Optical shop daily tasks -- Mass-produced specular surfaces -- Non-specular, near-flat, mass-produced surfaces -- Enhancing regular interferometric sensitivity.
주제 Interferometry.
Optical measurements.
Optical instruments --Testing.
Engineering instruments.
보유판 및 특별호 저록 Print version 0819491403 9780819491404 , 2013031940
ISBN 9780819491411, 9780819491404, 9780819491428
기타 표준번호 10.1117/3.928443
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