서지주요정보
Stray light analysis and control
서명 / 저자 Stray light analysis and control / Eric C. Fest.
저자명 Fest, Eric C. aut
단체명 Society of Photo-optical Instrumentation Engineers.
발행사항 Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE Press, [2013]
Online Access http://dx.doi.org/10.1117/3.1000980 URL

서지기타정보

서지기타정보
청구기호 QC372.2.D4 F47 2013eb
형태사항 1 PDF (204 pages) : illustrations.
총서명 SPIE Press monograph ; PM229
언어 English
일반주기 "SPIE Digital Library."--Website.
서지주기 Includes bibliographical references.
내용 Preface -- Acknowledgments -- Chapter 1. Introduction and terminology -- Chapter 2. Basic radiometry for stray light analysis -- Chapter 3. Basic ray tracing for stray light analysis -- Chapter 4. Scattering from optical surface roughness and coatings -- Chapter 5. Scattering from particulate contaminants -- Chapter 6. Scattering from black surface treatments -- Chapter 7. Ghost reflections, aperture diffraction, and diffraction from diffractive optical elements -- Chapter 8. Optical design for stray light control -- Chapter 9. Baffle and cold shield design -- Chapter 10. Measurement of BSDF, TIS, and system stray light -- Chapter 11. Stray light engineering process -- Index.
주제 Optical instruments --Design and construction.
Light --Scattering.
보유판 및 특별호 저록 Print version 0819493252 9780819493255 , 2012049924
ISBN 9780819493262 (electronic) , 9780819493255 (print)
기타 표준번호 10.1117/3.1000980
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