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Molecular Secondary Ion Mass Spectrometry / Pachuta, Steven J.; Cooks, R. Graham / http://dx.doi.org/10.1021/bk-1985-0291.ch001 -- Particle Bombardment as Viewed by Molecular Dynamics / Garrison, Barbara J. / http://dx.doi.org/10.1021/bk-1985-0291.ch002 -- Role of Intermolecular Interactions in the Desorption of Molecular Ions from Surfaces / Macfarlane, Ronald D. / http://dx.doi.org/10.1021/bk-1985-0291.ch003 -- Processes of Laser-Induced Ion Formation in Mass Spectrometry / Hillenkamp, F., Institute of Biophysics, University of Frankfurt, Abtlg. für Biophysikalische Strahlenforschung, Frankfurt, Federal Republic of Germany; Karas, M., Institute of Biophysics, University of Frankfurt, Abtlg. für Biophysikalische Strahlenforschung, Frankfurt, Federal Republic of Germany; Rosmarinowsky, J., Gesellschaft für Strahlen- und Umweltforschung, München, Federal Republic of Germany / http://dx.doi.org/10.1021/bk-1985-0291.ch004 -- Angle-Resolved Secondary Ion Mass Spectrometry / Winograd, Nicholas / http://dx.doi.org/10.1021/bk-1985-0291.ch005 -- Secondary Ion Mass Spectrometer Design Considerations for Organic and Inorganic Analysis / Magee, C. W. / http://dx.doi.org/10.1021/bk-1985-0291.ch006 -- Liquid Metal Ion Sources / Barofsky, Douglas F. / http://dx.doi.org/10.1021/bk-1985-0291.ch007 -- Fast Atom Bombardment Mass Spectrometry Technique and Ion Guns / Perel, Julius / http://dx.doi.org/10.1021/bk-1985-0291.ch008 -- Fast Atom Bombardment Secondary Ion Mass Spectrometry Surface Analysis / Leys, J. A. / http://dx.doi.org/10.1021/bk-1985-0291.ch009 -- Secondary Ion Mass Spectrometry: A Multidimensional Technique / Colton, Richard J., Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000; Kidwell, David A., Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000; Ramseyer, George O., General Electric Company, Syracuse, NY 13221; Ross, Mark M., Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000 / http://dx.doi.org/10.1021/bk-1985-0291.ch010 -- Fast Atom Bombardment Combined with Tandem Mass Spectrometry for the Study of Collisionally Induced Remote Charge Site Decompositions / Jensen, Nancy J., Midwest Center for Mass Spectrometry, Department of Chemistry, University of Nebraska, Lincoln, NE 68588; Tomer, Kenneth B., Midwest Center for Mass Spectrometry, Department of Chemistry, University of Nebraska, Lincoln, NE 68588; Gross, Michael L., Midwest Center for Mass Spectrometry, Department of Chemistry, University of Nebraska, Lincoln, NE 68588; Lyon, Philip A., Central Research Laboratories, 3M Company, St. Paul, MN 55144-1000 / http://dx.doi.org/10.1021/bk-1985-0291.ch011 -- Analysis of Reactions in Aqueous Solution Using Fast Atom Bombardment Mass Spectrometry / Caprioli, Richard M. / http://dx.doi.org/10.1021/bk-1985-0291.ch012 -- Applications of Fast Atom Bombardment in Bioorganic Chemistry / Williams, Dudley H. / http://dx.doi.org/10.1021/bk-1985-0291.ch013 -- Use of Secondary Ion Mass Spectrometry to Study Surface Chemistry of Adhesive Bonding Materials / Baun, W. L. / http://dx.doi.org/10.1021/bk-1985-0291.ch014
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