| 청구기호 |
QC355.3 .E837 2019eb |
| 형태사항 |
1 online resource (various pagings) : illustrations (some color).
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| 총서명 |
[IOP release 6]
IOP concise physics, 2053-2571
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| 언어 |
English |
| 일반주기 |
"Version: 20191001"--Title page verso.
"A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.
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| 내용 |
1. Introduction and structure of the course -- 2. Geometrical optics -- 2.1. Fermat's principle -- 2.2. Lenses and principal planes -- 2.3. Compound lens systems -- 2.4. Illumination of optical systems
3. Waves and diffraction -- 3.1. Mathematical description of a wave -- 3.2. Interference -- 3.3. Phasors -- 3.4. Diffraction from a finite slit -- 3.5. Diffraction from a finite slit : phasor treatment -- 3.6. Diffraction in two dimensions
4. Fraunhofer diffraction -- 4.1. Fraunhofer diffraction -- 4.2. Diffraction and wave propagation
5. Fourier methods in optics -- 5.1. The Fresnel-Kirchhoff integral as a Fourier transform -- 5.2. The convolution theorem -- 5.3. Some useful Fourier transforms and convolutions -- 5.4. Fourier analysis -- 5.5. Spatial frequencies -- 5.6. Abb?e theory of imaging -- 5.7. Spatial resolution of the compound microscope -- 5.8. Diffraction effects on image brightness
6. Optical instruments and fringe localisation -- 6.1. Division of wavefront -- 6.2. Division of amplitude
7. The diffraction grating spectrograph -- 7.1. Interference pattern from a diffraction grating -- 7.2. Effect of finite slit width -- 7.3. Diffraction grating performance -- 7.4. Blazed (reflection) gratings -- 7.5. Effect of slit width on resolution and illumination
8. The Michelson (Fourier transform) interferometer -- 8.1. Michelson interferometer -- 8.2. Resolving power of the Michelson spectrometer -- 8.3. The Fourier transform spectrometer -- 8.4. The Wiener-Khinchin theorem -- 8.5. Fringe visibility
9. The Fabry-P?erot interferometer -- 9.1. The Fabry-P?erot interference pattern -- 9.2. Observing Fabry-P?erot fringes -- 9.3. Finesse -- 9.4. The instrument width -- 9.5. Free spectral range, FSR -- 9.6. Resolving power -- 9.7. Practical matters -- 9.8. Instrument function and instrument width
10. Reflection at dielectric surfaces and boundaries -- 10.1. Electromagnetic waves at dielectric boundaries -- 10.2. Reflection properties of a single dielectric layer -- 10.3. Anti-reflection coatings -- 10.4. Multiple dielectric layers : matrix method -- 10.5. High reflectance mirrors -- 10.6. Interference filters -- 10.7. Reflection and transmission at oblique incidence -- 10.8. Deductions from Fresnel's equations
11. Polarized light -- 11.1. Polarization states -- 11.2. Transformation and analysis of states of polarization -- 11.3. Optics of anisotropic media; birefringence -- 11.4. Production and manipulation of polarized light -- 11.5. Analysis of polarized light -- 11.6. Interference of polarized light.
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| 주제 |
Optics.
Optical physics. --bicssc
SCIENCE / Physics / Optics & Light. --bisacsh
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| 보유판 및 특별호 저록 |
Print version: 9781643276731
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| ISBN |
9781643276762, 9781643276748, 9781643276731 |
| 기타 표준번호 |
10.1088/2053-2571/ab2231 |
| QR CODE |
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