| 청구기호 |
QD96.A8 A39 2008eb |
| 판사항 |
1st ed.
|
| 형태사항 |
1 online resource (xvi, 295 pages) : illustrations
|
| 언어 |
English |
| 서지주기 |
Includes bibliographical references (pages 263-289) and index.
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| 내용 |
List of Abbreviations -- List of Symbols -- Preface -- Chapter 1. Preliminary Remarks and Historical Overview -- Chapter 2. Internal versus External Photoemission -- Chapter 3. Model Description and Experimental Realization of IPE -- Chapter 4. Internal Photoemission Spectroscopy Methods -- Chapter 5. Injection Spectroscopy of Thin Layers of Solids: Internal Photoemission as Compared to Other Injection Methods -- Chapter 6. Trapped Charge Monitoring and Characterization -- Chapter 7. Charge Trapping Kinetics in the Injection-Limited Current Regime -- Chapter 8. Transport Effects in Charge Trapping -- Chapter 9. Semiconductor-Insulator Interface Barriers -- Chapter 10. Electron Energy Barriers Between Conducting and Insulating Materials -- Chapter 11. Spectroscopy of Charge Traps in Thin Insulating Layers -- Chapter 12. Conclusions -- References.
|
| 주제 |
Photoelectron spectroscopy.
Photoemission.
Semiconductors --Junctions.
Photoelectron spectroscopy. --fast --(OCoLC)fst01061561
Photoemission. --fast --(OCoLC)fst01061564
Semiconductors --Junctions. --fast --(OCoLC)fst01112231
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| 보유판 및 특별호 저록 |
Print version: Afanas?ev, V.V. Internal photoemission spectroscopy. 1st ed. Oxford, UK ; Boston : Elsevier, 2008 9780080451459 0080451454 , 166379668
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| ISBN |
9780080451459
, 0080451454
, 1281096113
, 9781281096111
, 9786611096113
, 6611096116
, 0080555896
, 9780080555898
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| QR CODE |
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